(Thin Film Thickness Measurement and more!)
model | wavelength range | spectrometer/detector | light source | thickness | specification |
---|---|---|---|---|---|
Vis | 400-1100 | Spectrometer F4/Si CCD 3600 pixels/ ADC- 16 bit |
Tungsten-Halogen | 15nm- 75¥ìm | Precision - 0.01nm or 0.01% Accuracy - 0.2% or 1nm Stability - 0.02nm or 0.03% Spot size - 2mm stadard , down to 3 um Sample size - from 5mm |
UVVisSR | 200-1100 | Spectrometer F4/Si CCD 2048 pixels/ ADC- 16 bit | Deuterium/ Tungsten-Halogen |
1nm-75¥ìm | Precision - 0.01nm or 0.01% Accuracy - 0.2% or 1nm Stability - < 0.02nm or 0.03% Spot size - 2mm stadard , down to 3 um Sample size - from 1mm |
HRVis | 700-1000 | Spectrometer F4/Si CCD 2048 pixels/ ADC- 16 bit /resolution | Tungsten-Halogen | 1¥ìm-400¥ìm | Precision - 0.01nm or 0.01% Accuracy - 0.1% or 1nm Stability - < 0.02nm or 0.03% Spot size - 0.5mm stadard , down to 3 um Sample size - from 1mm Measurement time - <50ms, 15Hz |
UVVis-RT | 200-1000 | F4/Si CCD 2048 pixels/ ADC 16 bit/Optical Switch(Reflectance & Transmittance) | Tungsten-Halogen | 1nm-75¥ìm | Precision - 0.01nm or 0.01% Accuracy - 0.2% or 1nm Stability - 0.05nm or 0.03% Spot size - 2mm stadard Sample size - from 1mm |
NIR | 900-1700 | F2 Spectrometer InGaAs CCD 512 pixels: ADC- 16 bit | Tungsten-Halogen | 50nm- 85¥ìm | - |
VisNIR | 400-1700 | Two spectrometer channels/ detectors (F4 Si 3600 pixels CCD and F2 InGaAs 512 pixels PDA) /ADC- 16 bit | Tungsten-Halogen | 10nm- 85¥ìm | - |
UVVis-NIR | 200-1700 | Two spectrometer channels/ detectors (F4 Si 3600 pixels CCD and InGaAs 512)/ ADC 16 bit | Deuterium/Tungsten-Halogen | 1nm-85¥ìm | - |
VisXT | 800-870 | F4 spectrometer/Si 2048 pixels CCD | Tungsten-Halogen | 10¥ìm-1400 ¥ìm | - |